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Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e., read and write operations affect only a single bit in the memory. Traditionally, word-oriented memories have been tested by repeated application of a test for bit-oriented memories whereby a different data background (which depends on the used intra-word fault model) is used during each iteration. This results in time inefficiencies and limited fault coverage.
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Goor et al. (1998) studied this question.