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March 27, 2025IEEE Transactions on Electron Devices0 citations

Impact of the Endurance Measurement Methodology on Ferroelectric Field Effect Transistor Under the Capacitive Nondestructive Read

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OPOmkar PhadkePRPrasanna Venkatesan RavindranHMHalid Mulaosmanovic

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Phadke et al. (2025) studied this question.

synapsesocial.com/papers/6a2005d06bd9e57b9265afefhttps://doi.org/10.1109/ted.2025.3552545
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