Crystal Structure Analysis of Multiwalled Carbon Nanotube Forests by Newly Developed Cross-Sectional X-ray Diffraction Measurement

A novel cross-sectional X-ray diffraction method was developed to evaluate crystal structures of multiwalled carbon nanotube (CNT) forests. Aligned degree of the graphene volume in the CNT forest could be quantified by this analysis. The domain sizes of the CNTs in the forests were estimated using a modified Scherrer's equation for bending multilayered graphene sheets. The statistical information of the crystal structure of the CNT forests including the degree of alignment, domain size, layer numbers, and interlayer spacing d002 will contribute to developing applications of CNT forests for devices and functional materials.