Three analog design-for-testability (DFT) schemes used to test the analog portion of a mixed-signal circuit are presented. The mixed-signal device-under-test is partitioned into analog and digital macros and structured access is provided to the analog macros to enhance observability and controllability. The proposed test methodology integrates analog testing with the existing digital test techniques to form a single DFT framework for mixed-signal devices.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Jarwala et al. (2002) studied this question.
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