Estimation of thin-oxide reliability using proportional hazards models

Proportional hazards models for estimating thin-oxide dielectric reliability and time-dependent dielectric-breakdown hazard rates are developed. Two groups of models are considered: group one ignores interactions between temperature and electric field, while group two considers several forms of interactions. The inclusion of interaction is not statistically significant at the 1% level. An analysis of the Hokari time-dependent dielectric-breakdown data, in terms of the form of the electric-field acceleration factor, shows that the approach of I.C. Chen et al. (1985) is more appropriate than the approach of D.L. Crook (1979).< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>