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Accurate measurements are presented of the thickness of helium films on cleaved surfaces of alkaline-earth fluoride crystals at 1. 38 ^oK. The films were measured between 10 and 250 using an acoustic interferometry technique. The data are in excellent agreement with calculations based on the Lifshitz theory of van der Waals forces. Calculations of the film thickness on a variety of other substrates are also given.
Sabisky et al. (Thu,) studied this question.