March algorithms are widely used in DRAM testing. They are relatively simple yet providing high fault coverage especially with respect to stuck-at faults, address uniqueness faults, and some types of cell-interaction faults. At the same time the capability of traditional March tests to detect pattern-sensitive faults is rather limited. This paper proposes an approach to enhance March test detection capability with respect to the pattern-sensitive faults.
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Yarmolik et al. (2002) studied this question.
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