Key points are not available for this paper at this time.
A linear absolute dilatometer based on a three-terminal parallel-plate capacitor design has been used to obtain thermal expansion data for high-purity copper and aluminum from 5 to 320 K. These data have an absolute accuracy of ±0.1% above 20 K for copper and above 30 K for aluminum, and agree well with published data at the higher temperatures. The disagreement which exists with other data below 5 K for copper and below 15 K for aluminum is believed to be sample dependent, but the mechanism is not known. The aluminum results in this region depend on the state of annealing of the sample.
Kroeger et al. (1977) studied this question.