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The author points out the importance of the involvement of the design and manufacturing team in achieving reliability of microelectronic devices. A method of verifying reliability goals through calculation of failure rates based on life test parameters is described. An example illustrating the method is shown.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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J. Wayne Meredith (2003) studied this question.
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