The results of a measurement campaign aimed at determining the far-field diffuse scattering pattern of typical building walls are shown in the paper. Such results are then used to determine and tune simple diffuse scattering models based on the effective roughness approach, to be embedded into ray tracing simulators. It is shown that by adopting an appropriate single-lobe scattering pattern the agreement between simulation and measurement is very good
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Degli‐Esposti et al. (2007) studied this question.