The results of investigations into the effect of geometrical surface structure in x‐ray fluorescence analysis of Cu‐Ni alloy are presented. The experimental materials were samples of spectrometric standard quality, in which surfaces were especially prepared by grinding and polishing. The surface state was estimated qualitatively, using a scanning electron microscope, and quantitatively, using a profilograph, by the determination of the roughness parameters R a and R z . The relationships between the roughness parameters and Cu, Ni and Si fluorescent radiation intensities, as well as the scattered radiation from the x‐ray tube anode element were established. The optimum range of the surface state for a given alloy has been defined.
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Stankiewicz et al. (1983) studied this question.
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