Analysis of electron inelastic-scattering data with application to Cu

The reduction of electron inelastic-scattering data to a form which can be compared to results of optical experiments and to band calculations is discussed. An improved and efficient method of calculating plural scattering is described and applied to a measured spectrum. Various aspects of surface scattering are discussed, especially as they pertain to the analysis procedure. Results, including dielectric constants, for Cu are shown and are compared to band calculations.