The nanoscale electro‐reduction in a memristive oxide is a highly relevant field for future non‐volatile memory materials. Photoemission electron microscopy is used to identify the conducting filaments and correlate them to structural features of the top electrode that indicate a critical role of the three phase boundary (electrode‐oxide‐ambient) for the electro‐chemical reduction. Based on simulated temperature profiles, the essential role of Joule heating through localized currents for electro‐reduction and morphology changes is demonstrated.
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Lenser et al. (2014) studied this question.
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