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Quantum dot quantum computing architectures rely on systems in which inversion symmetry is broken, and spin-orbit coupling is present, causing even single-spin qubits to be susceptible to charge noise. We derive an effective Hamiltonian for the combined action of noise and spin-orbit coupling on a single-spin qubit, identify the mechanisms behind dephasing, and estimate the free induction decay dephasing times T2* for common materials such as Si and GaAs. Dephasing is driven by noise matrix elements that cause relative fluctuations between orbital levels, which are dominated by screened whole charge defects and unscreened dipole defects in the substrate. Dephasing times T2* differ markedly between materials and can be enhanced by increasing gate fields, choosing materials with weak spin-orbit, making dots narrower, or using accumulation dots.
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Bermeister et al. (2014) studied this question.
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