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Study designs a quality control chart to enhance device monitoring and defect detection.
This study’s goal was to design a new individual observation chart for quality control by utilizing the discrete wavelet transformation (DWT) approach to calculate the mean time between reliability failures. The new chart’s effectiveness was demonstrated by comparing it to a classical chart. This aspect is crucial in addition to the conclusion that the production process is under control for both charts, with the new chart exhibiting a reduced standard deviation. The study’s main focus was on a new area for device monitoring and defect detection, which involves halting production and eliminating any potential causes of defects. One of the main elements that aid in achieving the goals of predictive maintenance is the individual control chart based on the mean time between failures with DWT of the operating time between failures.
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Birdawod et al. (2025) studied this question.
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