Integrating design and test presents a good challenge in today's analog circuit manufacturing process. Designs should be made according to the sensitivity of the output to all the components. Furthermore, sensitivity can be used to observe component deviation (soft faults) and hard faults from the output. This paper presents an automated sensitivity analysis tool, called LIMSoft, which offers the possibility of sensitivity computation and analysis in order to design fault-resistant circuits and generate test vectors for both soft and hard faults. Some applications for integrating test and design are also presented.
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Hamida et al. (2002) studied this question.
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