Total time on test (TTT) plots provide a useful graphical method for tentative identification of failure distribution models. Identification is based on properties of the TTT transform. New properties of the TTT transform distribution are obtained. These results are useful to the user of TTT plots. Although IFR (DFR) distributions are particularly easy to identify from TTT plots, the user must exercise caution relative to identification of IFR A (DFRA) distributions.
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Richard E. Barlow (1979) studied this question.
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