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Intentionally inducing worst-case thermal runaway scenarios in Li-ion cells on-demand is a definitive way to test the efficacy of battery systems in safely mitigating the consequences of catastrophic failure. An internal short-circuiting (ISC) device is implanted into three 18650 cell designs: one standard, one with a bottom vent, and one with a thicker casing. Through an extensive study of 228 cells, the position at which thermal runaway initiates is shown to greatly affect the tendency of cells to rupture and incur side-wall breaches at specific locations. The risks associated with each failure mechanism and position of the ISC device are quantified using a custom calorimeter that can decouple the heat from ejected and non-ejected contents. Causes of high-risk failure mechanisms, such as bursting and side-wall breaches, are elucidated using high-speed synchrotron X-ray imaging at 2000 frames per second and image-based 3D thermal runaway computational models, which together are used to construct a comprehensive description of external risks based on internal structural and thermal phenomena.
Finegan et al. (Sun,) studied this question.