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Study illustrates particle geometry control enhancing electric-magnetic dipole interference in nanoparticles, suggesting new applications in optical sensing.
Silicon Nanoparticles In Research Article e73389, Taeyeong Kim and Jungchul Lee illustrate a wafer-scale fabrication process for axis-ratio-engineered silicon nanoparticles through pillar formation, annealing, oxidation, and release. Deterministic control of particle geometry drives on-resonance overlap of electric and magnetic dipoles, enabling strong forward scattering. The work links scalable nanofabrication with single-particle optical control, refractometric sensing, and label-free bio-interfacial monitoring.
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Kim et al. (2026) studied this question.
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