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June 10, 2026Journal of the Textile Institute

FAC-DETR: a lightweight fabric defect detection model integrating Fourier convolution and multiscale linear attention

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Authors

BZBotao ZhangHYHaiting YuJRJia Ren

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Overview

Randomized trial shows improved fabric defect detection accuracy in industrial environments, suggesting high efficiency.

Key Points

  • Evaluate the effectiveness of FAC-DETR for enhancing defect localization and minimizing false positives in fabric inspection.
  • Redesigned the backbone network with Cross-Stage Partial structure.
  • Integrated Fourier convolution for improved feature extraction.
  • Incorporated a Multi-Scale Linear Attention mechanism to optimize critical defect region identification.
  • Achieved a 4.2% increase in mAP@0.5 and a 7.6% gain in mAP@0.5:0.95 compared to baseline methods.
  • Demonstrated mAP@0.5 scores of 94.2% and 97.1% on MVTec and an industrial dataset, respectively.
  • Used 1.37 million fewer parameters while improving accuracy.

Cite This Study

Zhang et al. (2026) studied this question.

synapsesocial.com/papers/6a29012e6f82f25be989d7eehttps://doi.org/10.1080/00405000.2026.2680852
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