Study of the electrical chatter characteristics of a rough electrode under dynamical loading

This study presents a computationally efficient method for modeling the interaction between dynamic characteristics and contact mechanics in electrical chatter, defined as sharp increases in electrical contact resistance due to structural vibrations. Hemispherical surface asperities are modeled within a spring-mass-damper dynamical system using principles derived from the Greenwood-Williamson family of rough surface models and the Hertzian contact solution. The electrical contact resistance, calculated as constriction resistance, is a key focus in investigating the behavior of electrical chatter. The effects of connector preload and the stiffness of the supporting structure on electrical chatter, and the system’s dynamic characteristics are considered. The results reveal that less rigid connectors produce lower frequency chatter events, which are more prolonged and highly variable in duration. In contrast, stiffer connectors lead to higher frequency chatter events that are shorter and more uniform in duration. The proposed approach provides valuable insights into optimizing the design of electrical connectors to minimize critical system failures due to electrical chatter.