Demonstrates a novel technique for characterizing ultrafast laser pulses across six octaves, suggesting improvements in diagnostic tool applications.
We report the temporal characterization of a femtosecond light source spanning more than six octaves, from the ultraviolet (210–220 nm) to the mid-infrared (15–16 μm), using the recently developed plasma-induced frequency-resolved optical switching (PI-FROSt) technique. A commercial optical parametric amplifier equipped with harmonic-generation and difference-frequency modules is characterized, including the signal, idler, second- and third-harmonic beams, and mid-infrared extensions. All measurements are performed with the same optical setup and switching medium, without any realignment or change of nonlinear elements. These results establish PI-FROSt as a unique, broadband, phase-matching-free, and damage-free diagnostic tool for ultrafast sources.
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Espaignol et al. (2026) studied this question.
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