ABSTRACT Lateral perovskite photodetectors (PDs) suffer from severe operational instability due to the proliferation of defect states. Recognizing that continuous healing of defect states is crucial for sustained performance, we introduce a dynamic white‐light compensation (WLC) approach that actively replenishes defect states during device operation. Our methodology employs saturated‐solution confined‐space and free‐space crystallization techniques to in situ fabricate micrometer‐scale perovskite plates on interdigitated electrodes, yielding both pristine single‐crystal (SC) and intentionally defective polycrystalline configurations. Upon WLC application, defective devices exhibit a linear, intensity‐dependent enhancement in PD performance across both single‐ and two‐photon regimes, ultimately saturating at the performance benchmark of SC devices under super‐threshold WLC. This WLC strategy thus functions as a self‐healing optical feedback loop, offering a highly feasible and straightforward solution for device performance regulation. Critically, long‐term aging tests reveal the robustness of this approach: a 150 day‐aged device, which initially suffered 53% degradation in photocurrent response, was rejuvenated to 96.9% of its original performance through super‐threshold WLC. This work not only provides a practical pathway for maintaining the operational stability of lateral perovskite PDs but also establishes a new paradigm for dynamic, in situ defect management in open‐structured optoelectronic systems.
Zhang et al. (Fri,) studied this question.