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November 5, 2010Physical Review BOpen Access

Thermal dissipation and variability in electrical breakdown of carbon nanotube devices

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Authors

ALAlbert LiaoMicron (United States)RARouholla AlizadeganUniversity of Illinois Urbana-ChampaignZOZhun‐Yong OngInstitute of High Performance Computing

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Liao et al. (2010) studied this question.

synapsesocial.com/papers/6a61c2b4f5a6cede3a89a552https://doi.org/10.1103/physrevb.82.205406
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