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In this letter, the AlGaN/GaN/graded-AlGaN: Si-doped/GaN double channel (GDC-SI) high electronic mobility transistors (HEMTs) with high saturation current density and linearity have been reported for low voltage applications. Compared with the standard AlGaN/GaN/AlGaN/GaN double channel GaN (SDC) HEMTs, the GDC-SI HEMTs exhibited the higher saturation current, the broader and flatter transconductance profile, the lower transconductance (g ₌) derivatives, and lower on-resistance (R ₎₍). Due to the Si-doped graded bottom barrier present in GDC-SI HEMTs, the profile of current gain cutoff frequency (f ₓ) and the maximum oscillation frequency (f ₌₀ₗ) were flatter with the bias voltage increased. The output power density of 0. 75 W/mm and power added efficiency (PAE) of 58% were achieved for GDC-SI HEMTs, at the drain voltage of 7 V and the test frequency of 3. 6GHz. The output third-order intercept point (OIP3) of 39. 3 dBm and saturation current density of 1909 mA/mm are achieved, which are the state-of-the-art saturation current and OIP3 in the double-channel GaN HEMTs.
Yu et al. (Fri,) studied this question.