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Comparison between piezoelectric force microscopy images and current-voltage data consecutively obtained using conductive atomic force microscopy below transition voltages for a highly oriented ferroelectric BiFeO3 nano-island confirms that ferroelectric polarization reversal induces transitions of forward-direction, and thus down- and up-polarization is accompanied by positive- and negative-forward diode-like behavior, respectively. As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
Hong et al. (Thu,) studied this question.