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SUMMARY The environmental scanning electron microscope (ESEM) allows the examination of specimens in a gaseous environment. It is based on an integration of efficient differential pumping with a new design of electron optics and detection systems. Backscattered, cathodoluminescence and X‐ray detectors can be designed to fit and to perform optimally in the ESEM. The secondary electron signal can be detected with the gaseous detector device, which is a new multipurpose detector. Insulating, uncoated, wet and generally both treated or untreated specimens can be studied.
G. D. Danilatos (Sat,) studied this question.