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The valence band offset of wurtzite-InN∕AlN (0001) heterojunctions is determined by x-ray photoelectron spectroscopy to be 1.52±0.17eV. Together with the resulting conduction band offset of 4.0±0.2eV, a type-I heterojunction forms between InN and AlN in the straddling arrangement.
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King et al. (2007) studied this question.
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