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In this study, we investigated the structural properties of In1−xScxN thin films and studied their phase evolution and lattice behavior across varying Sc concentrations. XRD analysis was employed to determine the phase stability and to identify the critical composition range when the transition from wurtzite to cubic structure occurs. The corresponding changes in lattice parameters were quantified by calculating a and c. Optical transmission measurements combined with absorption coefficient analysis and Moss–Burstein corrections enabled the estimation of the optical bandgap, which exhibited a systematic blue shift in the wurtzite phase with increasing Sc content. Our findings lay a crucial groundwork for deeper exploration of this novel material system and seek to inspire wider research into its potential for different application fields.
Afshar et al. (Fri,) studied this question.