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The electric-pulse-induced resistive switching properties of TiO 2 , Al 2 O 3 , Al 2 O 3 /TiO 2 , and Al 2 O 3 /TiO 2 /Al 2 O 3 thin films were studied by current-voltage (I-V) measurements using Pt/insulator/Ru structures and conductive atomic force microscopy. The switching parameters of the TiO 2 film were stable, whereas those of the Al 2 O 3 films show random variations during repeated I-V measurements. Both films show resistive switching by a filamentary switching mechanism with linear conduction behavior in the low V region. The stacked film shows a bias polarity-dependent switching behavior. This suggests that the nucleation of the conducting filaments occurs at the interface where the electrons are injected.
Kim et al. (Sun,) studied this question.
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