Impact of Interfacial Microstructure on Charge Carrier Transport in Solution‐Processed Conjugated Polymer Field‐Effect Transistors

The surface roughness of a dielectric is precisely tuned, allowing a fine control solely over the interfacial microstructure in a semicrystalline semiconductor polymer film without affecting the morphology in the upper layers. The interfacial microstructure is found to have only a minor impact on the transport originating from bypassing of interfacial defects by the charge carriers.