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Unusual corrugations observed in scanning-tunneling-microscope (STM) images of 1T-TaS₂, Si (111) (21), and graphite are explained, and are shown to be characteristic of materials where the Fermi surface has collapsed to a point at the corner of the surface Brillouin zone. This is the first clear case where the low-bias STM image is dominated by electronic structure effects rather than surface geometry. Implications for STM spatial resolution are discussed.
J. Tersoff (Mon,) studied this question.