A strong and stable ultraviolet photoluminescence (PL) band (370 nm) together with a red luminescence band around 670 nm with a 730 nm shoulder were observed in Mn-passivated porous silicon (PS) prepared by the hydrothermal technique. The surface structure is examined by Fourier infrared and x-ray photoelectron spectroscopy analysis. The 670 nm band was confirmed to be the usually observed PL band in PS, and the appearance of the 370 nm band and 730 nm shoulder peak was interpreted based on surface structure characterization and spectroscopy measurements.
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Chen et al. (2000) studied this question.
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