This paper describes the steps necessary to develop a soft-error methodology that can be used at the circuit-simulation level for accurate nominal soft-error prediction. It addresses the role of device simulations, statistical simulation, analytical soft-error rate (SER) model development, and SER-model calibration. The resulting approach is easily automated and generic enough to be applied to any type of circuit for estimation of the nominal SER.
No takes yet. Share an insight, caveat, or question.
Walstra et al. (2005) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: