X-ray diffraction analysis of ultradisperse systems: The Debye formula

Problems of X-ray diffraction analysis of ultradisperse systems with the particle size up to 5 nm are discussed in the review. A method for calculating X-ray diffraction patterns using the Debye formula within the kinematic theory of X-ray scattering (Debye Function Analysis-DFA) is presented. The DFA method makes it possible to obtain information on the atomic structure, shape and size of nanoparticles, and verify hypotheses on the presence of deformations, stacking faults and other structural features of ultradisperse and nanostructured systems. The method is applicable for modeling the diffraction patterns of objects with an arbitrary (not necessarily crystal) structure. Applications of the method for examining the structure of various objects are discussed.