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January 1, 1994Journal of Research of the National Institute of Standards and TechnologyOpen Access

Precision comparison of the lattice parameters of silicon monocrystals

E. G. Kessler Albert Henins R.D. Deslattes Lars K. Nielsen M. Arif

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Abstract

, This measurement is consistent with absolute lattice spacing measurements made at PTB and NIST. Components of uncertainty associated with systematic effects due to misalignments are derived and estimated.

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Kessler et al. (1994) studied this question.

synapsesocial.com/papers/6a6f200226a7f98052dbded0 https://doi.org/10.6028/jres.099.002

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