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We show that polarity-dependent resistance switching in GeSbTe thin films depends strongly on Sb composition by comparing current-voltage characteristics in Sb-excess Ge2Sb2+xTe5 and stoichiometric Ge2Sb2Te5 samples. This type of switching in Ge2Sb2+xTe5 films is reversible with both continuous and pulsed dc voltages less than 1.5 V. Low and high resistance states of this switching can be attributed to formation and rupture, respectively, of electrically conductive Sb-bridges between the Ge2Sb2Te5 crystals and electrodes through the resistive amorphous phase. The coexistence of polarity-dependent resistance switching with amorphous-crystalline phase-changes renders great opportunities to expand the applicability of GeSbTe films for data storage applications.
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Pandian et al. (2009) studied this question.
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