Multi (four and eight)-fold path interferometers have been developed for the purpose of dilatometric measurements. The interferometers have two advantages compared to a usual interferometer. One is the self-compensation of the optical misalignment caused by the thermal deformation of the measuring components during the measurement. The other is that no special finish of the specimen surface is required. A very high stability of about 1 nm for eight hours has been confirmed from the experiment.
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Okaji et al. (1983) studied this question.
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