We report a novel technique to determine the index change in Li2O in-diffused surface layer in LiNbO3 by observing the cutoff angle of the extraordinary substrated mode as it refracts through the surface-layer–substrate interface. Surface-layer index changes from 10−4 to 10−2 were measured in various samples which received compensation treatments for times of 10 min to 6 h, primarily in LiNbO3 powder. We also report the successful compensation of nearly single-mode Ti : LiNbO3 channel waveguides.
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Burns et al. (1978) studied this question.
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