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January 1, 1964physica status solidi (b)

Electron Microscopy and Diffraction of Thin Films: Interpretation and Correlation of Images and Diffraction Patterns

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HOH. M. OtteMartin Marietta Materials (United States)JDJatis Kumar DashSRM UniversityHSH. F. SchaakeEPIR Technologies (United States)

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Otte et al. (1964) studied this question.

synapsesocial.com/papers/6a6f2e76fe4101aa97dfb6dahttps://doi.org/10.1002/pssb.19640050310
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