In this study, the authors report on the fabrication processes to realize the freestanding ZnO micromechanical structures on Si(111) substrates. Arrays of freestanding cantilevers and microbridges have been fabricated using a combination of dry etching techniques. The mechanical properties of the released ZnO structures are characterized by micro-Raman spectroscopy. The residual stress in these freestanding micromechanical structures is determined from the E2(2) phonon peak shift. Such a method to realize the freestanding structures on Si platform would be useful for the fabrication of ZnO-based microelectromechanical systems and sensors.
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Vicknesh et al. (2007) studied this question.
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