The study was undertaken to determine electrical properties of three Indian banana cultivars during ripening. Capacitance, relative permittivity, impedance and admittance were measured at different frequency ranges from 10 kHz to 1 MHz for each stage of ripening. The observed resu lts showed that capacitance, relative permittivity and admittance values increase with the time duration of ripening for all three varieties. However, the impedance value was found to be decreasing linearly for all varieties during ripening. Robusta cultivar had maximum values of all the properties followed by Poovan and Karpuravalli. In the frequency ranges of 10 kHz to 1 MHz, the electrical properties of Indian banana are correlated linearly to ripening stages. Results of this study are highly use-full for development of a non destructive banana quality measuring device.
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Selvam et al. (2018) studied this question.
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