Thin-film optical waveguides of the photorefractive optical material bismuth germanium oxide (Bi12GeO20) have been epitaxially grown onto heated zirconia substrates by excimer laser ablative sputtering. The epitaxial nature and stoichiometry of the films were verified using x-ray diffraction analysis. Waveguide modes were observed for effective refractive indices in close agreement with theoretical predictions.
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Youden et al. (1991) studied this question.
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