Quasi-TEM surface impedance approaches for the analysis of MIC and MMIC transmission lines, including both conductor and substrate losses

The surface impedance approach is applied to the quasi-TEM spectral domain analysis of MIC and MMIC lines with lossy metallizations in both the weak skin effect and the strong skin effect regimes. The use of the spectral domain technique makes possible the analysis of lines with multilayer iso/anisotropic substrates, including semiconductor and/or magnetic layers. PC computer codes have been developed following the proposed technique. Computation times within a few seconds are achieved.>