The dependence of magnetostriction of sputtered Co-Cr thin films on crystal structure

The saturation magnetostriction λ of the sputtered Co-Cr films deposited on the glass substrate by means of a Targets Facing Type of Sputtering (TFTS) system was evaluated with varying Cr content, substrate temperature and argon gas pressure. X-ray diffraction analysis (XRD) was unable to distinguish α-phase crystallites of fcc structure from ε-phase crystallites of hcp structure in all the film specimens prepared for evaluating λ, since the