Structural Characterizations of Bi₂Sr₂CaCu₂O8+δ Twist Boundaries Using Advanced Transmission Electron Microscopy

Yimei Zhu; Liyan Wu; J.-Y. Wang; Q. Li; Y. Tsay; M. Suenaga

doi:10.1017/s143192769797032x

September 1, 1997Microscopy and Microanalysis

Structural Characterizations of Bi₂Sr₂CaCu₂O8+δ Twist Boundaries Using Advanced Transmission Electron Microscopy

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Key Points

Resolve the atomic-scale structure and interfacial arrangements of twist grain boundaries in Bi2Sr2CaCu2O8+δ superconductors.
Examined Bi2Sr2CaCu2O8+δ twist boundary interfaces using advanced transmission electron microscopy.
Analyzed atomic coordination and lattice alignments across rotated crystallographic planes.
Atomic-scale imaging resolved the structural transitions and lattice disruptions occurring across twist boundary interfaces.
Interface characterization provides baseline structural data for understanding how crystalline misorientation affects superconducting coherence.

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Implication

Microscopy investigation reveals the atomic configurations of twist boundaries in Bi2Sr2CaCu2O8+δ superconductors, highlighting structural features that influence interface transport.

Abstract

Structural Characterizations of Bi 2 Sr 2 CaCu 2 O 8FATAL ERROR -- Missing abstract.plus;FATAL ERROR -- Missing abstract.

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Zhu et al. (1997) studied this question.

synapsesocial.com/papers/6a6fa26d35aa2c282ce0f90a https://doi.org/10.1017/s143192769797032x

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Structural Characterizations of Bi₂Sr₂CaCu₂O8+δ Twist Boundaries Using Advanced Transmission Electron Microscopy

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Abstract

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Structural Characterizations of Bi₂Sr₂CaCu₂O8+δ Twist Boundaries Using Advanced Transmission Electron Microscopy

Key Points

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Abstract

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