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Exit-angle-dependent and angle-integrated Auger-plasmon-satellite intensities are calculated as a function of depth of the Auger emitter into a (Jellium) metal substrate, and as a function of Auger-line energy. The use of measurements of such intensities is proposed as a means of determining the concentration of adatoms versus atomic layer in adsorption experiments.
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Peter J. Feibelman (1973) studied this question.
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