1.3 µm laser diodes with butt-jointed selectively grown spot-size converters have been successfully fabricated on a 2 in InP substrate. Their threshold current and far-field patterns were uniformly distributed over the 2 in wafer. These uniform characteristics were obtained by combining uniform MOVPE growth, wet etching, and CH4/H2 reactive ion etching.
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Okamoto et al. (1996) studied this question.
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