Epitaxial Thin Film Growth of Lanthanum and Neodymium Aluminate Films on Roll‐Textured Nickel Using a Sol‐Gel Method

As part of an effort to develop a new, non‐vacuum‐processed substrate for high current superconducting films, thin films of LaAlO 3 and NdAlO 3 were deposited on biaxially textured (100) nickel substrates using a solution deposition technique. On heating to 1150°C in Ar‐4% H 2 for 1 h, epitaxial films were obtained. Out‐of‐plane alignment was confirmed by obtaining rocking curves of the (002) plane of the LaAlO 3 (full width at half‐maximum (fwhm) = 7.2°) and the NdAlO 3 (fwhm = 5.8°) films. In‐plane alignment was demonstrated by obtaining phi scans of the (110) plane of the LaAlO 3 (fwhm = 13.4°) and the NdAlO 3 (fwhm = 8.8°) films. Grain alignment in the films is approximately equivalent to the alignment of the Ni substrate. Analysis of pole figures indicated that in both films there are two in‐plane orientations present, the major being (001)[100] and the minor (001)[110].