An energy‐momentum transport model for sub‐micron silicon devices is modified to include new sets of simple interband scattering models representing impact ionization, auger recombination, trapping and photo generation. These have been developed using a simplified physical modelling approach. A discretization scheme suitable for application to an irregular spatial grid is presented. The resulting model is suitable for the study of small geometry effects in silicon devices.
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Roberts et al. (1990) studied this question.
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